Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Name: Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
Brand: imada.pl
SKU: SKU165724
Price: 9.99 USD
Availability: InStock
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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, Pre-Owned in GOOD condition. Book has various underlining and high-lighting. May contain inscriptions on inside of front or back cover.Shipped with USPS Media Mail.

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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
Pre-Owned in GOOD condition. Book has a few underlining and high-lighting. May contain inscriptions on inside of front or back cover.
Shipped with USPS Media Mail.

This product is flawless for anyone looking for quality Outdoor products.